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德國(guó)Attocube Systems AG
物體超高精度的空間定位在納米新興領(lǐng)域極其重要，為了滿足這一市場(chǎng)需求，attocube systems AG 研發(fā)出了新型精確定位專利技術(shù)。超薄超小的鈦平移臺(tái)使其在低溫(10 mK - 300 K)、高磁場(chǎng)(+28 T)、超高真空(5.10-11 mbar) 的極端環(huán)境條件下能正常運(yùn)行。這是定位市場(chǎng)革命性的進(jìn)步，引領(lǐng)了眾多領(lǐng)域內(nèi)的新研究。這一優(yōu)良的納米定位模塊被世界上許多實(shí)驗(yàn)室熟知，應(yīng)用于掃描探針技術(shù)，如掃描電子顯微鏡、掃描隧道顯微鏡、近場(chǎng)光學(xué)顯微鏡等。此外，該產(chǎn)品還可供包括光導(dǎo)纖維和固體波導(dǎo)在內(nèi)的普通光操控使用。
attocube systems AG 產(chǎn)品既包括供實(shí)驗(yàn)室使用的單機(jī)簡(jiǎn)易定位原件，也包括為低溫－ / UHV（超高真空）SPM（掃描探針顯微鏡）提供完整的自動(dòng)化集成方案，主要包括不同種類的CFM（共焦距顯微鏡）、AFM（原子力顯微鏡）、NSOM（近場(chǎng)掃描光學(xué)顯微鏡）和STM（掃描隧道顯微鏡），這些產(chǎn)品能在溫度為300 mK、高磁場(chǎng)和真空環(huán)境中使用。
配合具有多種SPM（掃描探針顯微鏡）模式的創(chuàng)新型、高靈活性控制系統(tǒng)，attocube systemsAG 的產(chǎn)品將會(huì)更加完善。各種SPM（掃描探針顯微鏡）硬件和軟件模塊可獲得簡(jiǎn)單任務(wù)圖像，二維、三維軟件使圖像經(jīng)過(guò)加工后在視覺(jué)上更吸引人、更專業(yè)，印刷效果更好。
作為低溫掃描探針市場(chǎng)的領(lǐng)導(dǎo)者，我們一直努力幫助顧客獲得更可靠的科學(xué)成果，所以我們的目標(biāo)是開(kāi)發(fā)從科學(xué)研究到行業(yè)應(yīng)用范圍內(nèi)的新技術(shù)和新產(chǎn)品。
Ultra-high precision spatial positioning of objects is of prime importance in the emerging field
of nanotechnology. attocube systems? patented new type of precision-positioning technology
is based on an innovative concept that meets those market demands. The ultra-compact
Titanium translation stages allow operation under extreme environmental conditions as
cryogenic temperatures (10 mK - 300 K), high magnetic fields (+28 T) and ultra high vacuum
environments (5.10-11 mbar). This attribute presents a revolutionary advancement for the
positioning market leading to new research in numerous areas.
Applications of these outstanding nanopositioning modules, well-known in many labs around
the world, include scanning probe techniques such as scanning electron microscopy, confocal
microscopy, scanning force microscopy, scanning tunneling microscopy and near-field optical
microscopy, to name just a few. Furthermore, they are suitable for general beam manipulation
applications involving optical fibers and solid state waveguides.
The product line of attocube systems AG ranges from stand-alone simple positioning
components for laboratory applications to complete automated and integrated solutions for
low temperature- / UHV- scanning probe microscopy (SPM). The product range includes
different species of Confocal Microscopy (CFM), Atomic Force Microscopy (AFM), Nearfield
Scanning Optical Microscopy (NSOM) and Scanning Tunneling Microscopy (STM)
offering operation modes down to 300 mK as well as high magnetic field and vacuum
compatibility.
The product range is completed by innovative and highly flexible control systems for multiple
SPM modes. Various SPM hardware and software modules make image acquiring a simple
task. 2D and 3D software allow image processing for visually appealing, professional and
publishable results.
As a market leader for low-temperature Scanning Probe we continuously work on supporting
our customers to achieve reliable scientific results efficiently. Thus, our aim is to open up new
possibilities ranging from scientific research to industrial applications.